| Title |
A Study on the Temperature Variation Characteristics of Power VDMOSFET |
| Authors |
Lee, Woo-Sun(Lee, Woo-Sun) |
| Abstract |
Double-diffused metal oxide power semiconductor field effect transistors are used extensively in recent years in various circuit applications. The temperature variation of the drain current at a fixed bias shows both positive and negative resistance characteristics depending on the gate threshold voltage and gate-to source bias votage. In this paper, the decision method of the gate crossover voltage by the temperature variation and a new method to determine the gate threshold voltage graphecally are presented. |