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The Transactions of the Korean Institute of Electrical Engineers

The Transactions of the Korean Institute of Electrical Engineers

ISO Journal TitleTrans. Korean. Inst. Elect. Eng.
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2020-10

P.1

The Transactions of the Korean Institute of Electrical Engineers / Information for Authors / Submission Checklist / KIEE COPYRIGHT FORM

편집부(Editor)
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P.1

[Contents] The Transactions of the Korean Institute of Electrical Engineers; Vol. 69, No. 10, October 2020

편집부(Editor)
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P.1415

A Particle Swarm Optimization for Combined Heat and Power Operation Considering Heat Extraction and Network Constraint

김태형(Taehyoung Kim) ; 임정택(Jeongtaek Lim) ; 함경선(Kyung Sun Ham) ; 서재완(Jaewan Suh)
https://doi.org/10.5370/KIEE.2020.69.10.1415
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P.1426

Economic Analysis of Korea-China Interconnection Power Line Considering Both of Environmental Cost and the Differences of Power Transaction Cost

정희원(Hui-Won Jeong) ; 차준민(Junmin Cha) ; 이규섭(Gyu-Sub Lee)
https://doi.org/10.5370/KIEE.2020.69.10.1426
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P.1432

A Novel Fault Type Identification and Fault Restoration Visualization for Substation

이경민(Kyung-Min Lee) ; 홍재영(Jae-Young Hong) ; 강태원(Tae-Won Kang) ; 박철원(Chul-Won Park)
https://doi.org/10.5370/KIEE.2020.69.10.1432
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P.1440

Analyze the Root cause of a VT Fuse and Suggest the Solution

김순용(Soon-Yong Kim) ; 박진엽(Jin-Yeub Park) ; 정필범(Pil-Bum Jeong)
https://doi.org/10.5370/KIEE.2020.69.10.1440
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P.1445

Battery ESS Fault Analysis based on the ESS Ground/Shortcircuit Test

김수열(Soo-Yeol Kim) ; 임지훈(Ji-Hoon Im) ; 이일용(Il-Yong Lee) ; 김진태(Jin-Tae Kim) ; 최인규(In-Kyu Choi) ; 김형근(Hyeong-Geun Kim)
https://doi.org/10.5370/KIEE.2020.69.10.1445
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P.1456

Study on the Offline Inter-turn Fault Diagnosis According to the Parameter of Permanent Magnet Synchronous Motor

김현우(Hyunwoo Kim) ; 박예지(Yeji Park) ; 오승택(Seoung-Taek Oh) ; 장형관(Hyungkwan Jang) ; 배재남(Jae-Nam Bae) ; 이주(Ju Lee)
https://doi.org/10.5370/KIEE.2020.69.10.1456
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P.1464

A Study on the Standard for Measuring of Converter Fed Motor Efficiency

장기봉(Ki-Bong Jang)
https://doi.org/10.5370/KIEE.2020.69.10.1464
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P.1470

Impact of Displacement Defect on Laterally Diffused MOS (LDMOS) using Numerical Simulation

김정식(Jungsik Kim)
https://doi.org/10.5370/KIEE.2020.69.10.1470
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